All in one solution Correlative Light

and Electron Microscopy


Delphi is the world's first fully integrated CLEM solution that enables fast correlative microscopy with unique overlay precision. Correlative light and electron microscopy (CLEM) is the combination of fluorescence and electron microscopy and thus a powerful technique to combine the power and versatility of fluorescence microscopy to acquire fluorescence images and to easily place these images with functional information in a structural context.

Easy and fast
The system is extremely easy to use for both light- and electron-microscopy users who do not require experienced microscopy skills to image and interpret data.

Due to a patented overlay feature the Delphi provides a user- and sample independent overlay of fluorescence and electron images prior to imaging, discarding the need for adding fiducial markers to the sample.

Small footprint
The Delphi is designed as table-top microscope, limiting the demand for extra space and facilities and offering extreme ease-of-use.

integrated CLEM

The Delphi is an all-in-one solution for correlative microscopy. It is an integrated tabletop scanning electron microscope and inverted fluorescence microscope. This integration enables scientists to do correlative microscopy without the challenges typically associated with CLEM:

  • The Region Of Interest (ROI) does not need to be retrieved, as you are working in the same ROI switching from LM to EM and vice versa.
  • The sample does not need to be transferred from one microscope to the other, saving sample quality as well as time.
  • Correlation accuracy is fully automated and highly precise.

Seamless imaging

With an integrated setup, there is no need to retrieve your region of interest. Switching between imaging modalities is seamless.

Perfect overlay

Integrated systems are uniquely capable of harnessing the power of the combination to provide a perfect unbiased overlay. The unbiased overlay means that reliable results can be obtained by any user.

Reliable results

With integrated CLEM, the transfer step between the two microscopes is eliminated. This greatly reduces the risk of sample damage and alteration. Moreover, the alignment procedure of the Delphi is unique, fully automated and independent of both user and sample.

Higher throughput

An integrated setup reduces correlative workflow time and allows you to do more experiments for quantitative results.


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Delphi is a result of a unique collaboration between two Dutch companies, DELMIC and Phenom-World and their respective networks bringing a game-changing platform to market within a period of 12 months after project kick-off.

Almost 70 years ago Philips built its first Electron Microscopes in Eindhoven. Already back then, Delft University played a key role”, according to Emile Asselbergs, CEO of Phenom-World. “The Delphi is another example that fits in the Eindhoven-Delft tradition of jointly developing high-quality electron microscopy systems”.

Development of a complicated microscope such as the Delphi normally takes years, but we pulled it off much faster. Time from project kick-off to commercial release is 12 months. That in itself is a major accomplishment”, states Sander den Hoedt, CEO of DELMIC.

For more information and specifications about the Delphi please visit

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